Todd J. Kumler


  • New York
  • 212.605.5423

Todd Kumler consults on economic and statistical matters related to antitrust and competition and claims of consumer fraud and product liability. Dr. Kumler applies econometric tools and other empirical analyses to assess class certification, liability, and damages issues. He leads teams to analyze large, complex datasets, and works with clients through all stages of litigation. He supports the preparation and submission of expert reports, depositions, and trial testimony.

Antitrust and competition

Dr. Kumler has worked on high-profile antitrust litigation and regulatory investigations involving technology and telecommunications. His industry expertise also includes computer components, consumer products, and pharmaceuticals. He has supported experts on class certification issues as well as liability and damages.

Dr. Kumler has consulted on matters involving allegations of price fixing, monopolization, tying, and other exclusionary practices. He was a lead consultant on Epic v. Apple, which Global Competition Review recognized as its 2022 Matter of the Year. Dr. Kumler has worked on several other antitrust matters in the technology industry, including FTC v. Qualcomm.

Consumer fraud and product liability

Dr. Kumler has analyzed large, proprietary datasets in high-profile matters involving class certification and estimation of damages in the automobile industry. He has consulted on multiple matters on behalf of Volkswagen, including In re Volkswagen “Clean Diesel” Marketing, Sales Practices, and Products Liability Litigation; Nemet et al. v. Volkswagen Group of America Inc. et al.; and MacKinnon v. Volkswagen Group Canada Inc. et al.

He also has significant experience with class certification issues arising in matters related to personal care products and durable goods.

Pro bono

Dr. Kumler is active in the firm’s pro bono initiatives, and has led efforts on multiple pro bono cases, including State of Georgia v. Dennis Arnold Perry and Tinsley et al. v. McKay et al.